I. G. Lyubich, “Improving the Shannon function upper estimate of the length of single diagnostic tests sets for inverse faults of gates”, Intelligent systems. Theory and applications, 2021, Volume 25, Issue 4,Pages <nobr>157

Part 2. Mathematics and Computer Science

Improving the Shannon function upper estimate of the length of single diagnostic tests sets for inverse faults of gates

I. G. Lyubich

PAREXEL

Abstract: It is proved that, in any complete basis, any Boolean function can be realized by an irredundant circuit that admits a diagnostic test of length no more than 3 in case of inverse faults at the outputs of gates.

Keywords: Boolean circuit, single fault diagnostic test set, inverse fault at output of gate, Shannon function, easily testable circuit.