I. G. Lyubich, D. S. Romanov, “Multiple fault k-diagnostic test sets for inverse faults of gates”, Intelligent systems. Theory and applications, 2021, Volume 25, Issue 4,Pages <nobr>161

Part 2. Mathematics and Computer Science

Multiple fault k-diagnostic test sets for inverse faults of gates

I. G. Lyubich^a, D. S. Romanov^b

^a PAREXEL
^b Lomonosov MSU

Abstract: It is proved that any Boolean function can be realized by a k-irredundant Boolean circuit over an special finite complete basis such that the circuit admits a multiple fault k-diagnostic test set of cardinality at most 2 under inverse faults at outputs of gates.

Keywords: Boolean circuit, test set, inverse fault at output of gate, Shannon function.