Abstract:
Tin dioxide thin films sensing ethanol vapors above the room temperature (38$^\circ$Ñ) were deposited by RF magnetron sputtering onto silicon substrates. Microstructure measurements using scanning electron microscopy and atomic force microscopy demonstrate that samples consist of grains shaped rods with nanometer diameters which are oriented normally to the substrate surface. There are pores between the grains penetrating the entire thickness of the films.
Keywords:thin film sensor, tin dioxide, morphology, room temperature gas sensitivity.