Waveguide-dielectric resonance in systems with nanometer metal layer on dielectric substrate

High sensitivity of an electromagnetic wave transmission spectra to change the thickness of the nanometer metal layers on dielectric plates in the case of the waveguide-dielectric resonance emergence due to the waveguide cross section is partially filled across the width and asymmetrically occupied relative to its middle by the investigated structure has been established. The microwave method of measurements the metal films thickness in the layered metal-dielectric structures which are partially filling the cross section of the waveguide has been theoretically and experimentally justified.