Abstract:
The theoretical and experimental justifications of the possibility to use the microwave photonic crystals for the creation of broadband loads have been presented. The possibility to simultaneously determine the thickness and the conductivity of nanometer semiconductor layered structures by use of the microwave photonic crystals has been shown. The possibility of electrical control of the microwave photonic crystals amplitude-frequency characteristic has been experimentally demonstrated. The means to reduce the sizes of the devices based on the microwaves photonic crystals have been determined.
Keywords:microwave photonic crystal, loads, measurements of thickness and conductivity, nanometer semiconductor structures, amplitude-frequency characteristic controlling, microwave microscope’s resonator.