Upper estimate of unreliability of schemes in full finite basis (in $P_2$) for arbitrary faults of gates

We consider the realization of Boolean functions by circuits from unreliable functional gates in full finite basis. We assume that each gate of the circuit is exposed to arbitrarily faults, and the gates faults are statistically independent. We construct the circuits for all Boolean functions and get their upper bound of the unreliability which depends on the worst (the most unreliable) of the basic gate.