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JOURNALS // Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki // Archive

Pis'ma v Zh. Èksper. Teoret. Fiz., 2011 Volume 93, Issue 1, Pages 13–17 (Mi jetpl1796)

This article is cited in 11 papers

CONDENSED MATTER

Low-temperature conductance of the weak junction in InAs nanowire in the field of AFM scanning gate

A. A. Zhukova, Ch. Volkb, A. Windenbc, H. Hardtdegenbc, Th. Schäpersb

a Institute of Solid State Physics RAS, 142432 Chernogolovka, Russia
b Institute of Bio- and Nanosystems (IBN-1): Semiconductor Nanoelectronics, Juelich, Germany
c JARA-Fundamentals of Future Information Technology, Research Centre Jülich, 52425 Jülich Germany

Abstract: We investigate the conductance of the InAs nanowire in the presence of electrical potential created by AFM scanning gate. At helium temperature Coulomb blockade diamonds pattern give the same result for quantum dot sizes ratio as reveals scanning gate imaging. The essential influence of local electrical field direction on the tunneling rate through the weak junction in InAs wire is observed. To explain this behavior the redistribution of the electrons among conductive channels in the wire must be taken into account.

Received: 01.11.2010
Revised: 19.11.2010

Language: English


 English version:
Journal of Experimental and Theoretical Physics Letters, 2011, 93:1, 10–14

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