RUS  ENG
Full version
JOURNALS // Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki // Archive

Pis'ma v Zh. Èksper. Teoret. Fiz., 2011 Volume 94, Issue 3, Pages 220–223 (Mi jetpl1978)

This article is cited in 7 papers

CONDENSED MATTER

Study of the atomic and electronic structures of amorphous silicon nitride and defects in it

S. S. Nekrashevich

A. V. Rzhanov Institute of Semiconductor Physics of SB RAS, Novosibirsk

Abstract: The structure of amorphous silicon nitride obtained by cooling from a melt has been simulated by Car-Parinello molecular dynamics. Several types of Si-Si defect coordination have been revealed. It has been found that, in addition to normal Si-Si bonds, numerous double Si-Si bonds (Si-Si-Si defects) are present in the amorphous structure.

Received: 08.07.2010
Revised: 06.06.2011


 English version:
Journal of Experimental and Theoretical Physics Letters, 2011, 94:3, 202–205

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024