RUS  ENG
Full version
JOURNALS // Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki // Archive

Pis'ma v Zh. Èksper. Teoret. Fiz., 2004 Volume 80, Issue 3, Pages 179–183 (Mi jetpl2070)

This article is cited in 3 papers

ATOMS, SPECTRA, RADIATIONS

Near-field scanning optical microscopy based on surface-enhanced Raman scattering

V. S. Gorelika, O. N. Gadomskyb, A. S. Kunitsynb

a Physical Institute, Russian Academy of Sciences
b Ulyanovsk State University

Abstract: We describe a near-field optical microscopy technique based on the interaction of a probe molecule with the sample surface (e.g., with a flat metal surface) in the field of external optical radiation and consider the spontaneous Raman scattering characterized, in the presence of a metal surface, by the effective polarizability of the probe molecule, depending on the frequency and the distance to the sample surface. At certain distances from the probe molecule to the surface, the effective polarizability of this molecule (determined with allowance for the polarizing influence of the surface of a semi-infinite medium) at the Stokes frequency sharply increases in comparison to the quantum polarizability of an isolated molecule, which is indicative of the formation of optical near-field resonances. It is shown that the proposed method of near-field optical microscopy is characterized by high sensitivity and high spatial resolution (on the order of 1 Å).

PACS: 07.60.Pb, 78.35.+c

Received: 29.06.2004


 English version:
Journal of Experimental and Theoretical Physics Letters, 2004, 80:3, 157–160

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024