Interwell excitons in a lateral potential well in an inhomogeneous electric field

The luminescence of interwell excitons in double quantum wells based on GaAs/AlGaAs semiconductor heterostructures (n-i-n structures) in a lateral trap prepared with the use of an inhomogeneous electric field was studied at helium temperatures. A rather strong and inhomogeneous electric field occurred in the depth of the heterostructure when a current passed through the contact between the conducting tip of a tunneling microscope and the heterostructure surface to the bulk region containing a built-in gate. Because of the Stark shift of energy bands in the electric field, the photoexcited electrons and holes are spatially separated in neighboring quantum wells by a tunnel-transparent barrier and are bound into interwell quasi-two-dimensional excitons. These excitons have a dipole moment even in the ground state. Therefore, electrostatic forces in the inhomogeneous electric field cause the excitons to move in the plane of quantum wells toward the maximum field region and eventually accumulate in the lateral trap artificially prepared in such a way. The maximum trap depth achieved through the inhomogeneous electric field was 13.5 meV, and its lateral size was about 10 μm. It is shown that, in the traps prepared in this way, photoexcited interwell excitons behave with increasing concentration at sufficiently low temperatures (T=2K) in the same fashion as in the lateral traps caused by large-scale fluctuations of the random potential. At concentrations exceeding the percolation threshold, the interwell excitons condense into the lowest energy state in the trap.