Anomalous X-ray scattering and channeling inside hollow microcapillary structures

XANES L _2,3 spectra and the reflection spectra of silicon, obtained in the case of the grazing incidence of radiation onto channel walls of microchannel plates, are studied. The channeling of secondary long-wavelength X-ray radiation was observed due to anomalous scattering in the vicinity of L edges of silicon absorption. The spectral composition of the secondary radiation at the microchannel output remains unchanged. The surfacebound propagation of X-ray fluorescence excited inside microchannels is observed for angles of incidence of less than θ ≈ θ_c/2.