A. V. Sokolov, È. Z. Kurmaev, J. MacNaughton, A. Moewes, N. A. Skorikov, L. D. Finkelstein, “$\mathbf{\sigma} $ and $\mathbf{\pi}$-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements”, Pis'ma v Zh. Èksper. Teoret. Fiz., 2003, Volume 77, Issue 2,Pages 114

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CONDENSED MATTER

$\mathbf{\sigma} $ and $\mathbf{\pi}$-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements

A. V. Sokolov^a, È. Z. Kurmaev^a, J. MacNaughton^b, A. Moewes^b, N. A. Skorikov^a, L. D. Finkelstein^a

^a Institute of Metal Physics, Ural Division of the Russian Academy of Sciences, Ekaterinburg
^b Department of Physics and Engineering Physics, University of Saskatchewan

Abstract: Resonant inelastic X-Ray scattering of highly oriented pyrolytic graphite (HOPG) is observed above the C 1s threshold at different polarization angles. It is shown that combining the polarization and excitation energy dependence of X-Ray emission spectra makes it possible to perform the quantitative band mapping selective to the chemical bonding ($\sigma $ and $\pi $).

PACS: 78.70.-g, 71.25.Tn

Received: 24.12.2002

Language: English