T. E. Golikova, F. Hubler, D. Beckmann, N. V. Klenov, S. V. Bakurskiy, M. Yu. Kupriyanov, I. E. Batov, V. V. Ryazanov, “Critical current in planar SNS Josephson junctions”, Pis'ma v Zh. Èksper. Teoret. Fiz., 2012, Volume 96, Issue 10,Pages <nobr>743

This article is cited in 6 papers

CONDENSED MATTER

Critical current in planar SNS Josephson junctions

T. E. Golikova^a, F. Hubler^b, D. Beckmann^b, N. V. Klenov^c, S. V. Bakurskiy^c, M. Yu. Kupriyanov^c, I. E. Batov^a, V. V. Ryazanov^ad

^a Institute of Solid State Physics, Russian Academy of Sciences
^b Institute of Nanotechnology, Karlsruhe Institute of Technology
^c Skobeltsyn Institute of Nuclear Physics, Lomonosov Moscow State University
^d Moscow Institute of Physics and Technology (State University)

Abstract: Specific features of the proximity effect and Josephson behavior of submicron planar SNS junctions fabricated by electron beam lithography and shadow evaporation have been studied experimentally and theoretically. The critical current of the junctions has been found to drastically increase with a decrease in temperature, which is associated with a change in the effective size of the weak link owing to the additional SN interface.

Received: 17.10.2012