Abstract:
A surface electromagnetic wave has been excited on an atomically smooth silicon surface by an intense infrared femtosecond laser pulse as a result of its self-diffraction on a microscale short-lived optical inhomogeneity of the excitation region rather than on the roughness of its surface relief. This wave has been visualized in the form of the pattern of its interference with the same incident infrared ultrashort pulse, which corresponds to the instantaneous surface dielectric constant grating (reflection), as well as the resulting surface relief grating, using time-resolved far-field optical reflection microscopy.