Abstract:
The reflection X-ray spectra have been studied experimentally and theoretically in the case of the grazing incidence of radiation on the plane surface and walls of the channels of microchannel plates. The fine structure of the X-ray spectra, as well as the angular distribution of the field passed through microchannels, has been analyzed for the energy corresponding to the anomalous dispersion region of the $\mathrm{Si}$$L_{2,3}$ absorption edge. The theoretical calculations have been performed within the model including the transition layer on the surface of the sample.