Analysis of the structure and magnetic properties of an interface in multilayered (Fe/Si)$_N$ nanostructures with the surface-sensitive XMCD metho

The structural and magnetic properties of (Fe/Si)$_N$ nanostructures obtained by successive deposition on the SiO$_2$/Si(100) surface at a temperature of the substrate of $300$ K have been studied. The thicknesses of all Fe and Si layers have been determined by transmission electron microscopy measurements. The magnetic properties have been studied by the X-ray magnetic circular dichroism (XMCD) method near the Fe $L_{3, 2}$ absorption edges. The orbital $(m_l )$ and spin $(m_S)$ contributions to the total magnetic moment of iron have been separated. The thicknesses of magnetic and nonmagnetic iron silicide on the Si/Fe and Fe/Si interfaces have been determined with the surface sensitivity of the XMCD method and the model of the interface between the nonmagnetic and weakened magnetic phases.