Abstract:
Dimensional effects in the critical properties of multilayer Heisenberg films have been numerically studied by Monte Carlo methods. The effect of anisotropy created by the crystal field of a substrate has been taken into account for films with various thicknesses. The calculated critical exponents demonstrate a dimensional transition from two-dimensional to three-dimensional properties of the films with an increase in the number of layers. A spin-orientation transition to a planar phase has been revealed in films with thicknesses corresponding to the crossover region.