Fast and ultrafast energy-dispersive X-ray reflectrometry based on prism optics

Interference spectra of X-ray reflection from thin films have been obtained for the first time by the decomposition of the spectrum of a polychromatic beam by means of a diamond prism. The measurements of film nanostructures and reference absorption spectra have been performed at the ESRF synchrotron. The proposed spectrometric scheme allows obtaining the interference pattern in a wide range of the scattering vector length $q$ without angular scanning. This makes it possible to study ultrafast processes in layered nanostructures at an intense external action of laser pulses or charged particles with a time resolution of about the duration of an X-ray pulse.