A. A. Shiryaev, D. A. Zolotov, E. M. Suprun, I. G. Dyachkova, S. A. Ivakhnenko, V. E. Asadchikov, “Contribution of lattice defects to the intensity of quasi-forbidden X-ray reflections of diamond: comparison of X-ray topography and infrared spectroscopy data”, Pis'ma v Zh. Èksper. Teoret. Fiz., 2020, Volume 111, Issue 9,Pages <nobr>597

This article is cited in 4 papers

CONDENSED MATTER

Contribution of lattice defects to the intensity of quasi-forbidden X-ray reflections of diamond: comparison of X-ray topography and infrared spectroscopy data

A. A. Shiryaev^ab, D. A. Zolotov^c, E. M. Suprun^d, I. G. Dyachkova^c, S. A. Ivakhnenko^d, V. E. Asadchikov^c

^a Institute of Geology of Ore Deposits, Petrography, Mineralogy, and Geochemistry, Russian Academy of Sciences, Moscow, 119017 Russia
^b Frumkin Institute of Physical Chemistry and Electrochemistry, Russian Academy of Sciences, Moscow, 119071 Russia
^c Shubnikov Institute of Crystallography, FSRC Crystallography and Photonics, Russian Academy of Sciences, Moscow, 119333 Russia
^d Bakul Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kyiv, 04074 Ukraine

Abstract: New developments of application of X-ray topography in the quasi-forbidden (222) reflection from perfect crystals with diamond lattice to investigate defects are presented. The spatial distribution of intensities of (111) and (222) X-ray reflections is correlated with the distribution of point defects in synthetic diamonds of various types. It is shown that X-ray topography in the quasi-forbidden (222) reflection is a promising tool for investigation of weak stress fields in perfect crystals.

Received: 09.04.2020
Revised: 10.04.2020
Accepted: 10.04.2020

DOI: 10.31857/S1234567820090049