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JOURNALS // Pis'ma v Zhurnal Èksperimental'noi i Teoreticheskoi Fiziki // Archive

Pis'ma v Zh. Èksper. Teoret. Fiz., 2021 Volume 113, Issue 2, Pages 84–91 (Mi jetpl6341)

This article is cited in 4 papers

OPTICS AND NUCLEAR PHYSICS

Diffraction on a microbubble and the morphology of the silicon surface irradiated through glycerol by a pair of femtosecond laser pulses

N. A. Inogamovabc, S. A. Romashevskiya, A. I. Ignatovdb, V. V. Zhakhovskyba, V. A. Khokhlovc, E. M. Eganovae, E. A. Pershinae, S. I. Ashitkova

a Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow, 125412 Russia
b All-Russia Research Institute of Automatics, Moscow, 127055 Russia
c Landau Institute for Theoretical Physics, Russian Academy of Sciences, Chernogolovka, Moscow region, 142432 Russia
d National Research Moscow State University of Civil Engineering, Moscow, 129337 Russia
e Institute of Nanotechnologies of Microelectronics, Russian Academy of Sciences, Moscow, 119991 Russia

Abstract: The effect of two successive laser pulses on silicon placed in glycerol has been studied experimentally and numerically with electromagnetic, hydrodynamic, and atomistic simulation programs. It has been shown that a microbubble in the liquid is formed on the surface after the first pulse; then, the second pulse whose width is comparable with the diameter of the microbubble is diffracted on this microbubble. The calculated diffraction pattern and light intensity distribution on the silicon surface indicate that the maximum intensity at the diffraction peaks can be noticeably higher than the intensity on the axis of the incident Gaussian beam. An increase in the intensity concentrated in one bright narrow ring around the microbubble results in the formation of a characteristic groove surrounded by ridges on silicon. The molecular dynamics simulation has shown that intense heating at the diffraction peak is responsible for the melting and displacement of the melt from the center of heating. This leads to the formation of grooves with ridges having a profile similar to that measured in the experiment.

Received: 26.11.2020
Revised: 03.12.2020
Accepted: 03.12.2020

DOI: 10.31857/S1234567821020026


 English version:
Journal of Experimental and Theoretical Physics Letters, 2021, 113:2, 75–81

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