Abstract:
The behavior of a thin-film GeTe crystal induced by intense femtosecond laser pulses ($\lambda = 0.8$$\mu$m) has been studied using a pulsed electron diffractometer. The sample is an annealed 20-nm GeTe film on a copper grid with a carbon coating. It has been found that laser ablation results in the formation of an ultrathin GeTe crystal (assumingly, GeTe monolayer) with a high radiation resistance. Possible reasons for the detected nanosize effect are discussed.