A. V. Andreev, V. E. Asadchikov, A. V. Buzmakov, A. A. Konovko, S. V. Kuzin, A. A. Pertsov, Yu. V. Ponomarev, R. A. Senin, I. S. Smirnov, S. V. Шестов, V. N. Shkurko, “Two-dimensional image magnification in an asymmetric-reflection X-ray microscope”, Pis'ma v Zh. Èksper. Teoret. Fiz., 2007, Volume 85, Issue 1,Pages <nobr>106

This article is cited in 7 papers

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Two-dimensional image magnification in an asymmetric-reflection X-ray microscope

A. V. Andreev^a, V. E. Asadchikov^b, A. V. Buzmakov^b, A. A. Konovko^a, S. V. Kuzin^c, A. A. Pertsov^c, Yu. V. Ponomarev^a, R. A. Senin^b, I. S. Smirnov^d, S. V. Шестов^c, V. N. Shkurko^b

^a M. V. Lomonosov Moscow State University
^b Institute of Cristallography RAS
^c P. N. Lebedev Physical Institute, Russian Academy of Sciences
^d Moscow State Institute of Electronics and Mathematics

Abstract: The experimental results on the two-dimensional 20× magnification of an x-ray image obtained in an asymmetric-reflection x-ray microscope with the use of a laboratory source of x rays are discussed. The field of view is determined by the linear sizes of the detector and is equal to 0.5 × 0.5 mm in our experiment for an exposure time of 600 s.

PACS: 07.85.Fv, 41.50.+h, 68.37.Yz

Received: 16.11.2006