Abstract:
This paper considers the dependence exchange bias on the thickness of the intermediate layer of copper and temperature in polycrystalline thin films ferromagnet/nonmagnetic metal/antiferromagnet ($\mathrm{Fe/Cu/CoO}$). We have revealed oscillatory of exchange bias value in depending on the thickness of the copper layer. The oscillation of the most clearly manifested in a certain range of temperatures. For the first time by us detected the oscillation of the exchange bias with increasing temperature, these oscillations occur with a change of sign of the field exchange interaction.