Simulation of contact stiffness of a hemispherical island inclusion

Numerical analysis is carried out for constructing a model simulating the contact stiffness of a solitary hemispherical island inclusion in an infinitely extended substrate. The contact stiffness is measured using atomic force acoustic microscopy with tips having a constant contact radius. Finite element analysis using the isotropic model of the materials is employed for this purpose. The model can be used for studying nanocomposite materials.