Brief Communications

REDUCTION OF IMPLANTED SAMPLE CRYSTALLIZATION DYNAMICS DURING PULSED THERMAL EFFECT

V. V. Ryzhov, I. Yu. Turchanovskiĭ, S. B. Shemyakina

Institute of High Current Electronics, Siberian Branch of the USSR Academy of Sciences, Tomsk

UDC: 532,7S J

Received: 21.04.1985

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