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// Zhurnal Tekhnicheskoi Fiziki
// Archive
Zhurnal Tekhnicheskoi Fiziki,
1986
Volume 56,
Issue 4,
Pages
701–707
(Mi jtf134)
Quantum Electronics
USE OF INTERFEROMETERS BASED ON REFLECTION HOLOGRAMS IN THE INVESTIGATION OF LOCAL DEFORMATIONS
V. O. Indisov
,
V. S. Pisarev
,
V. P. Shchepinov
,
V. V. Yakovlev
Moscow Engineering Physics Institute
UDC:
531.715.1
Received:
16.04.1985
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Steklov Math. Inst. of RAS
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