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JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 1986 Volume 56, Issue 4, Pages 701–707 (Mi jtf134)

Quantum Electronics

USE OF INTERFEROMETERS BASED ON REFLECTION HOLOGRAMS IN THE INVESTIGATION OF LOCAL DEFORMATIONS

V. O. Indisov, V. S. Pisarev, V. P. Shchepinov, V. V. Yakovlev

Moscow Engineering Physics Institute

UDC: 531.715.1

Received: 16.04.1985



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