Brief Communications

EFFECT OF THE SAMPLE THICKNESS ON FRACTURE THRESHOLDS OF SEMICONDUCTING COVALENT CRYSTALS IRRADIATED BY PULSED ELECTRON-BEAMS

A. P. Balachov, L. N. Kogay, I. Ya. Kravchenko, S. B. Seleznev, E. Ph. Uvarov


UDC: 539.3

Received: 10.01.1984
Revised: 10.01.1985

Bibliographic databases:

•