INVESTIGATION OF THE THIN SIOX(O-GREATER-THAN-OR-EQUAL-TO-X-GREATER-THAN-OR-EQUAL-TO-2) FILMS ON SPECTRAL CHARACTERISTICS OF SILICON P-N TRANSITIONS

L. E. Klyachkin, L. B. Lopatina, A. M. Malyarenko, V. L. Sukhanov, N. V. Zabrodskaya

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

Received: 21.12.1984

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