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JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 1984 Volume 54, Issue 2, Pages 408–410 (Mi jtf1685)

Brief Communications

THE DEVELOPMENT OF THE POSITRON-ANNIHILATION METHOD FOR THE STUDY OF PROPERTIES OF MONOCRYSTALLINE SILICON

I. Ya. Dekhtyar, S. P. Likhtorovich, M. M. Nishchenko

Institute for Metal Physics of Ukraine Academy of Sciences

Received: 25.05.1983



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