RUS
ENG
Full version
JOURNALS
// Zhurnal Tekhnicheskoi Fiziki
// Archive
Zhurnal Tekhnicheskoi Fiziki,
1984
Volume 54,
Issue 2,
Pages
408–410
(Mi jtf1685)
Brief Communications
THE DEVELOPMENT OF THE POSITRON-ANNIHILATION METHOD FOR THE STUDY OF PROPERTIES OF MONOCRYSTALLINE SILICON
I. Ya. Dekhtyar
,
S. P. Likhtorovich
,
M. M. Nishchenko
Institute for Metal Physics of Ukraine Academy of Sciences
Received:
25.05.1983
Fulltext:
PDF file (460 kB)
Bibliographic databases:
©
Steklov Math. Inst. of RAS
, 2025