Brief Communications

DETERMINATION OF THICKNESS AND COMPOSITION OF EPITAXIAL LAYERS DURING GAAS-GA1-XALX-AS STRUCTURE FORMATION

D. I. Bilenko, O. Ya. Belobrovaya, A. S. Ignat'ev, V. G. Mokerov, S. E. Pylaev, I. V. Ryabinin, V. D. Tsiporukha

Saratov State University named after N. G. Chernyshevsky, Physics Department

UDC: 637.311.S3

Received: 19.03.1985
Revised: 16.07.1985

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