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JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive
Zhurnal Tekhnicheskoi Fiziki, 1983 Volume 53, Issue 9, Pages 1750–1753 (Mi jtf2535)
METHODS OF THE STUDY OF MICRODEFECTS IN SILICON MONOCRYSTALS ON AN X-RAY TOPOGRAPHIC DTS-1 SPECTROMETER

N. O. Krylova, E. K. Kovev, I. L. Shul'pina




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