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// Zhurnal Tekhnicheskoi Fiziki
// Archive
Zhurnal Tekhnicheskoi Fiziki,
1983
Volume 53,
Issue 12,
Pages
2398–2400
(Mi jtf2680)
Brief Communications
USE OF THE SPECTROSCOPY OF COMPLETE EXTERNAL REFLECTION FOR THE STUDY OF STRUCTURE OF IMPLANTED LAYERS
Y. V. Ponomarev
, Y. A. Turutin
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Steklov Math. Inst. of RAS
, 2026