RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 1983 Volume 53, Issue 12, Pages 2398–2400 (Mi jtf2680)

Brief Communications

USE OF THE SPECTROSCOPY OF COMPLETE EXTERNAL REFLECTION FOR THE STUDY OF STRUCTURE OF IMPLANTED LAYERS

Y. V. Ponomarev, Y. A. Turutin




Bibliographic databases:


© Steklov Math. Inst. of RAS, 2026