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JOURNALS
// Zhurnal Tekhnicheskoi Fiziki
// Archive
Zhurnal Tekhnicheskoi Fiziki,
1989
Volume 59,
Issue 8,
Pages
131–134
(Mi jtf3468)
Brief Communications
ULTRASONIC EFFECT ON POINTED DEFECTS IN SI-SIO2 SYSTEMS
A. P. Zdebskii
, D. I. Kropman
,
M. K. Sheĭnkman
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Steklov Math. Inst. of RAS
, 2025
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