Zhurnal Tekhnicheskoi Fiziki, 1989 Volume 59, Issue 9, Pages 156–158
(Mi jtf3511)
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Brief Communications
EFFECT OF THERMAL-TREATMENT OF FORMING OF DEFECTS REDUCING THE PRESSURE
OF BREAKDOWN OF HIGH-VOLTAGE SEMICONDUCTING DEVICES
N. M. Maslennikov, Y. I. Sidorov, T. P. Frolova, L. V. Turikova
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