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JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 1989 Volume 59, Issue 9, Pages 156–158 (Mi jtf3511)

Brief Communications

EFFECT OF THERMAL-TREATMENT OF FORMING OF DEFECTS REDUCING THE PRESSURE OF BREAKDOWN OF HIGH-VOLTAGE SEMICONDUCTING DEVICES

N. M. Maslennikov, Y. I. Sidorov, T. P. Frolova, L. V. Turikova




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