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// Zhurnal Tekhnicheskoi Fiziki
// Archive
Zhurnal Tekhnicheskoi Fiziki,
1990
Volume 60,
Issue 9,
Pages
43–50
(Mi jtf3979)
Optics, Quantum Electronics
MEASUREMENT OF MIGRATIONS AND DEFORMATIONS BY THE 4-EXPOSITION SPECKLE-PHOTOGRAPHY METHOD
V. P. Shchepinov
, N. G. Vlasov
, S. A. Novikov
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Steklov Math. Inst. of RAS
, 2025
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