RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 90, Issue 11, Pages 1817–1820 (Mi jtf5145)

This article is cited in 2 papers

XXIV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 10--13, 2020
Plasma

Application of novel multilayer normal-incidence mirrors for euv solar spectroscopy

S. V. Kuzina, A. A. Revaa, S. A. Bogacheva, N. F. Erkhovaa, N. N. Salashchenkob, N. I. Chkhalob, V. N. Polkovnikovb

a P. N. Lebedev Physical Institute of the Russian Academy of Sciences, Moscow
b Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod

Abstract: Recent significant progress in the development of multilayer normal-incidence EUV mirrors is primarily related to an increase in the reflection coefficient at the working wavelength, a decrease in the spectral width of the reflection curve, and application of high-efficiency multilayer coatings for short-wavelength (3–9 nm) and long wavelength (greater than 50 nm) spectral ranges. Such mirrors allow astrophysical study of the Sun, since relatively narrow spectral widths of the mirrors and high reflection coefficients make it possible to image corona in monochromatic lines. Telescopes based on the mirrors are promising for dynamic spectral diagnostics of the solar disk with the aid of imaging spectroscopy. The method is based on the detection of monochromatic images of the Sun using the EUV spectral lines with relatively high spatial and temporal resolution. Possible progress in the solar study related to application of specified optical elements is discussed.

Received: 03.04.2020
Revised: 03.04.2020
Accepted: 03.04.2020

DOI: 10.21883/JTF.2020.11.49967.113-20


 English version:
Technical Physics, 2020, 65:11, 1736–1739

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024