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Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 90, Issue 11, Pages 1870–1875 (Mi jtf5155)

This article is cited in 7 papers

XXIV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 10--13, 2020
Physics of nanostructures

The smoothing effect of si layers in multilayer Be/Al mirrors for the 17- to 31-nm range

R. S. Pleshkova, S. Yu. Zueva, V. N. Polkovnikova, N. N. Salashchenkoa, M. V. Svechnikova, N. I. Chkhaloa, P. Jonnardb

a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b Laboratoire de Chimie Physique – MatièreetRayonnement, UPMC Univ Paris 06/CNRS UMR 761411 Paris, France

Abstract: The smoothing effect of thin silicon films used as buffer layers in multilayer Be/Al mirrors optimized for wavelengths longer than 17.1 nm has been investigated. The objects of investigation have been near-normal incidence (an angle of incidence of 88$^\circ$) and grazing incidence (33.5$^\circ$) mirrors. This effect has been observed in multilayer Be/Si/Al mirrors with periods of up to at least 29 nm. For normal incidence mirrors optimized for a wavelength of 17.14 nm, a record-high value of the peak reflection coefficient, 62.5%, has been achieved at spectral selectivity $\lambda/\Delta\lambda$ = 59. The temporal stability of the mirrors has been studied.

Keywords: X-ray radiation, multilayer mirrors, magnetron sputtering, smoothing barrier layer.

Received: 16.04.2020
Revised: 16.04.2020
Accepted: 16.04.2020

DOI: 10.21883/JTF.2020.11.49977.135-20


 English version:
Technical Physics, 2020, 65:11, 1786–1791

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