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Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 90, Issue 11, Pages 1884–1892 (Mi jtf5157)

This article is cited in 1 paper

XXIV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 10--13, 2020
Physics of nanostructures

The microstructure of transition boundaries in multilayer Mo/Be systems

R. M. Smertina, V. N. Polkovnikova, N. N. Salashchenkoa, N. I. Chkhaloa, P. A. Yunina, A. L. Trigubb

a Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod
b National Research Centre "Kurchatov Institute", Moscow

Abstract: The microstructure of the Mo/Be multilayer periodic system has been investigated using the methods of reflectometry, diffractometry, and EXAFS spectroscopy. It is found that, in the Mo/Be system, a mixed zone with different compositions are formed at the interfaces. On the Mo-on-Be and Be-on-Mo interfaces, mixed zones with a composition similar to 野代$_{22}$ and 野代$_2$ are formed, respectively. After thermal annealing for 1 h, the structure of transition interfaces in the multilayer system remains stable. Upon further annealing, diffusion processes occur, leading to the formation of the other compound (野代$_2$ instead of 野代$_{22}$); however, the period of the structure remains unchanged. Such a behavior explains the increase in the reflectance of Mo/Be mirrors after 1-h annealing and its subsequent decrease for a longer annealing time.

Keywords: multilayer mirrors, EXAFS spectroscopy, interlayer regions, thermal stability, X-ray radiation.

Received: 22.04.2020
Revised: 22.04.2020
Accepted: 22.04.2020

DOI: 10.21883/JTF.2020.11.49979.142-20


 English version:
Technical Physics, 2020, 65:11, 1800–1808

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