RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 90, Issue 11, Pages 1922–1930 (Mi jtf5163)

This article is cited in 4 papers

XXIV International Symposium Nanophysics and Nanoelectronics, Nizhny Novgorod, March 10--13, 2020
Physical electronics

Ion-beam methods for high-precision processing of optical surfaces

I. G. Zabrodin, M. V. Zorina, I. A. Kas'kov, I. V. Malyshev, M. S. Mikhailenko, A. E. Pestov, N. N. Salashchenko, A. K. Chernyshev, N. I. Chkhalo

Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod

Abstract: Methods for high-precision processing of surface of optical elements using beams of accelerated ions are considered. Characteristics and parameters of the equipment and problems that can be solved are presented. It is shown that final correction of local shape errors is possible with the aid of small-size ion beam and axisymmetric correction/aspherization is possible using wide-aperture ion beam and ion polishing. Effective roughnesses of the surfaces of fused silica, sitall, Zerodur, and ULE$\circledR$ are obtained at spatial frequencies of $q\in$ [2.5 $\times$ 10$^{-2}$–6.0 $\times$ 10$^{1}$ $\mu$m$^{-1}$]. Examples of aspheric surfaces and aspherization profile are presented.

Received: 03.04.2020
Revised: 03.04.2020
Accepted: 03.04.2020

DOI: 10.21883/JTF.2020.11.49985.112-20


 English version:
Technical Physics, 2020, 65:11, 1837–1845

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024