Diagnostics of charged-particle beams with phase-space diagrams

Phase-space diagrams are proposed to be used to determine the quality of focusing of charged particles in ion-optical devices. Phase-space diagrams with nonlinear contours are indicative of nonlinearity of beam focusing and graphically demonstrate the aperture value at which this nonlinearity emerges and intensifies. This opens the possibility of construction of linear focusing lenses or aberration correctors that compensate for the optics nonlinearity.