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Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 90, Issue 2, Pages 257–263 (Mi jtf5386)

This article is cited in 2 papers

Solid-State Electronics

The properties of memristive structures based on (Co$_{40}$Fe$_{40}$B$_{20}$)$_{x}$(LiNbO$_{3}$)$_{100-x}$, nanocomposites synthesized on SiO$_{2}$/Si substrates

S. N. Nikolaeva, A. V. Emelyanovab, R. G. Chumakova, V. V. Ryl'kovac, A. V. Sitnikovad, M. Y. Presniakova, E. V. Kukuevaa, V. A. Deminab

a National Research Centre "Kurchatov Institute", Moscow
b Moscow Institute of Physics and Technology, Dolgoprudny, Moscow Region
c Kotelnikov Institute of Radioengineering and Electronics, Fryazino Branch, Russian Academy of Sciences
d Voronezh State Technical University

Abstract: The structural features and current–voltage curves of metal/nanocomposite/metal sandwiches based on (Co$_{40}$Fe$_{40}$B$_{20}$)$_{x}$(LiNbO$_{3}$)$_{100-x}$ nanocomposites synthesized on SiO$_{2}$/Si substrates were studied. Samples were fabricated by ion-beam sputtering of a composite target, which provided an opportunity to produce nanocomposites with different compositions $x$ = 5–48 at % in a single cycle. The results of electron microscopy analysis revealed that the obtained nanocomposites consisted of metallic granules in an amorphous nonstoichiometric matrix. These granules were $\sim$ 2 – 3 nm in size and had a near-spherical (slightly elongated along the growth direction) shape. The local chemical composition of nanocomposite films was examined using X-ray photoelectron spectroscopy. The structures demonstrated resistive switching with the highest ratio of resistances in the low- and high-resistance states ($\sim$10) achieved at $x\sim$ 13 at%. The number of write/erase cycles exceeded 10$^4$. The observed effect of resistive switching is attributable to the influence of oxygen vacancies on the tunneling conductivity of contacts of percolation granule chains with one of the electrodes of the structure, which is separated by a highly oxidized layer from the nanocomposite.

Keywords: nanocomposite, electron microscopy, resistive switching.

Received: 08.04.2019
Revised: 08.04.2019
Accepted: 03.07.2019

DOI: 10.21883/JTF.2020.02.48819.157-19


 English version:
Technical Physics, 2020, 65:2, 243–249

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