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Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 90, Issue 1, Pages 149–154 (Mi jtf5422)

This article is cited in 8 papers

Physical electronics

Resistivity of thin carbon films with different $sp$-bonds fractions

I. A. Zavidovskiy, O. A. Streletskii, O. Yu. Nischak, A. A. Haidarov, A. V. Pavlikov

Faculty of Physics, Lomonosov Moscow State University

Abstract: Carbon films with different extents of $sp$ hybridization have been grown by ion–plasma pulsed arc sputtering of graphite in a methane atmosphere. Using Raman scattering and transmission electron microscopy data, it has been shown that the content of the phase including carbon chains with $sp$ hybridization grows with increasing methane concentration in the working volume. The resistivity of carbon films correlates well with the fraction of $sp$-hybridized carbon in the films.

Keywords: $sp$-carbon, amorphous carbon, Raman spectroscopy, electron diffraction, transmission electron microscopy.

Received: 31.12.2018
Revised: 30.05.2019
Accepted: 30.05.2019

DOI: 10.21883/JTF.2020.01.48677.453-18


 English version:
Technical Physics, 2020, 65:1, 139–144

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© Steklov Math. Inst. of RAS, 2024