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Zhurnal Tekhnicheskoi Fiziki, 2019 Volume 89, Issue 11, Pages 1789–1794 (Mi jtf5476)

This article is cited in 3 papers

XXIII International Symposium on Nanophysics and Nanoelectronics, Nizhny Novgorod, March 11-14, 2019

Measurement error of interferometers with diffraction reference wave

A. A. Akhsakhalyan, D. A. Gavrilin, I. V. Malyshev, N. N. Salashchenko, M. N. Toropov, B. A. Ulasevich, N. N. Tsybin, N. I. Chkhalo

Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod

Abstract: An experimental setup and results on aberration of sources of a reference spherical wave (SRSW) based on a single-mode optical fiber with a subwavelength output aperture obtained with the aid of an optical part of recording system (OPRS) are presented. SRSW and OPRS are developed for referenceless interferometer with diffraction reference wave. Methods for minimization of the measurement error are proposed. The SRSW and OPRS provide subnanometer measurement accuracy for optics. An increase in the measurement accuracy of the interferometer to a picometer level is discussed.

Keywords: interferometry, aberration, diffraction reference wave, optical fiber.

Received: 28.03.2019
Revised: 28.03.2019
Accepted: 15.04.2019

DOI: 10.21883/JTF.2019.11.48346.115-19


 English version:
Technical Physics, 2019, 64:11, 1698–1703

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