RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2019 Volume 89, Issue 9, Pages 1412–1419 (Mi jtf5520)

This article is cited in 8 papers

Physics of nanostructures

Investigation of a contamination film formed by the electron beam irradiation

K. N. Orekhova, Yu. M. Serov, P. A. Dementev, E. V. Ivanova, V. A. Kravez, V. P. Usacheva, M. V. Zamoryanskaya

Ioffe Institute, St. Petersburg

Abstract: In the study of materials on electron probe devices in the field of action of the electron beam, a contaminating hydrocarbon film is formed, which affects the experimental results. In this paper, we have studied the influence of a contamination film on carbon-film-coated dielectrics on the intensity of cathodoluminescence and characteristic X-ray lines. The absorption coefficient of the contamination film in the visible and UV ranges has been determined. Filming mechanisms at different parameters of the electron beam have been discussed.

Keywords: contamination, hydrocarbon film, SEM, cathodoluminescence, X-ray microanalysis.

Received: 07.02.2019
Revised: 19.03.2019
Accepted: 27.03.2019

DOI: 10.21883/JTF.2019.09.48068.43-19


 English version:
Technical Physics, 2019, 64:9, 1336–1342

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024