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Zhurnal Tekhnicheskoi Fiziki, 2019 Volume 89, Issue 4, Pages 574–577 (Mi jtf5645)

This article is cited in 4 papers

Physical science of materials

Synthesis of hexagonal AlN è GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy

V. N. Bessolova, E. V. Gushchinaa, E. V. Konenkovaa, S. D. Konenkovb, T. V. L'vovaa, V. N. Panteleeva, M. P. Scheglova

a Ioffe Institute, St. Petersburg
b Saint Petersburg State University

Abstract: Synthesis of AlN and GaN layers on a Si(100) substrate by chloride vapor-phase epitaxy has been considered. The process includes sulfidizing of the silicon surface, nucleation and growth of an AlN layer, and then formation of a GaN/AlN structure. It has been found that in the case of a (100)Si substrate, GaN nucleates on buffer AlN layers that may have two crystallographic orientations in contrast to a Si(111) substrate, on which a buffer layer may have only one orientation. It has been shown that the treatment of the Si(100) substrate in an aqueous solution of (NH$_4$)$_2$S decreases the FWHM of the rocking curve for GaN(0002) by a factor of 1.5.

Received: 16.04.2018

DOI: 10.21883/JTF.2019.04.47315.152-18


 English version:
Technical Physics, 2019, 64:4, 531–534

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