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Zhurnal Tekhnicheskoi Fiziki, 2019 Volume 89, Issue 4, Pages 608–613 (Mi jtf5651)

Electrophysics, electron and ion beams, physics of accelerators

Ion-optical system of an ion source with energy focusing in the formed beam

I. A. Averina, A. S. Berdnikova, S. V. Masyukevicha, N. S. Samsonovab, N. R. Gall'b, L. N. Gall'a

a Institute for Analytical Instrumentation, Russian Academy of Sciences, St. Petersburg
b Ioffe Institute, St. Petersburg

Abstract: Ways to reduce ion beam intensity losses in a mass spectrometric ion source, which are caused by chromatic aberration of its immersion ion-optical system, are considered. These losses are rather significant in forming a beam from ions with a large energy spread. The reduction of aberration losses is especially important when ion sources are used jointly with mass analyzers with energy focusing. It is shown that these losses can be reduced significantly by using a new type of ion-optical system of the ion source, which includes achromatic elements. A special method for calculating such elements is given. Computer simulations have shown high efficiency of such elements in the ion-optical path of ion sources of mass spectrometers.

Received: 05.06.2018

DOI: 10.21883/JTF.2019.04.47321.222-18


 English version:
Technical Physics, 2019, 64:4, 564–568

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