The morphology and electronic properties of si nanoscale structures on a CaF$_{2}$ surface

The surface morphology, crystal structures, and band-energy parameters have been studied for nanofilms and regularly arranged nanoscale Si phases with a thickness of 1–2 nm. The bandgap thickness of nanocrystalline Si phases with 2 – 3 single layers is found to be $\sim$1.4 eV.