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JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive
Zhurnal Tekhnicheskoi Fiziki, 1987 Volume 57, Issue 2, Pages 345–348 (Mi jtf574)
APPLICATION OF TRICRYSTAL TOPOGRAPHY FOR THE DETECTION AND STUDY OF STRUCTURE DEFECTS IN CRYSTALS

I. A. Nikol'sky, P. V. Petrashen, M. A. Chernov


UDC: 548.734

Received: 20.12.1985



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