Abstract:
On the basis of numerical simulation, specificities of the effect of $dU/dt$ in 4H–SiC thyristor structures, related to realization of the recently discovered triggering $\alpha$-mechanism are analyzed. It is shown that one of the manifestations of this mechanism is a catastrophic reduction in the voltage blocked by a thyristor with an increase in temperature of the structure. Practical ways of eliminating this effect are discussed.