IR spectroscopy for precision monitoring of iron and chromium impurity diffusion profiles in zinc chalcogenides

A technique for precision rapid nondestructive monitoring of the dopant behavior in zinc chalcogenide–based laser media is reported. Results suggest that it is possible to determine the concentration profiles of Fe$^{2+}$ and Cr$^{2+}$ dopant ions in zinc chalcogenide by IR spectroscopy combined with an IR microscope in the concentration rage 5 $\times$ 10$^{17}$–2.5 $\times$ 10$^{20}$ atoms/cm$^3$ with a spatial resolution of several micrometers. The diffusion profiles of dopants have been taken for zinc chalcogenide codoped by several impurities.